Dimension Icon AFM

Large-Sample Atomic Force Microscope

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FORCE

Icon AFM incorporates the latest evolution of Bruker’s industry-leading nanoscale imaging and characterization technologies on a large sample tip-scanning AFM platform. The Icon’s temperature-compensating position sensors render noise levels in the sub-angstroms range for the Z-axis, and angstroms in X-Y. This level of performance has established the new generation of what Atomic Force Microscopy should be. Capabilities include Magnetic Force Microscopy, Piezoresponse Force Microscopy, Kelvin Probe Microscopy, and many other state-of- the-art techniques.

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